Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
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Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337
Nikon X-Tek XT V 160 X-Ray -2012 - JN2337

Nikon X-Tek XT V 160 X-Ray -2012 - JN2337

Nikon
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Description

Nikon X-Tek XT V 160 X-Ray -2012 - JN2337

Tube:  NanoTech 160 kV / 20 W Transmissive tube.  Microfocus source with 
submicron feature recognition

Detector: Varian 1313 digital/flat panel detector

Manipulation:  • 5-axis manipulator (X,Y,Z, Rotate, Tilt)

• 360° fly-around views while keeping region of interest consistently locked into the center of the field of view

• Tilt: 75 degree oblique view 

• Real-time imaging or automated inspection

CT hardware  

INSPECT-X CONTROL SOFTWARE 
• Minimum training time
• Board map for quick sample overview 
• Collision avoidance between all components of the system and sample